Sample Support Development for In-Situ Ultra-HRTEM Electrical Investigations
نویسنده
چکیده
In order to achieve this goal, the respective samples should be both simultaneously: eminently thin and free-standing. With respect to this technological challenge, world wide only few successful experiments are known. In case of semiconductor nanofoils so far no experiments are known. In case of graphene there is one, but very elaborate measuring principle. On this, a sheet of graphene is mounted on a standard TEM grid to realize an electrode from the samples backside. The second contact is made by a scanning tunneling microscope (STM) tip using a particular TEM–STM platform [2, 3].
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